2

Optimization of test parallelism with limited hardware overhead

Year:
1991
Language:
english
File:
PDF, 426 KB
english, 1991
3

Analyzing data for CMOS leakage faults

Year:
1985
Language:
english
File:
PDF, 345 KB
english, 1985
7

Aliasing errors in Parallel Signature Analyzers

Year:
1990
Language:
english
File:
PDF, 708 KB
english, 1990
8

Analysis of an Important Class of Non-Markov Systems

Year:
1982
Language:
english
File:
PDF, 784 KB
english, 1982
9

Linearly Correlated Intermittent Failures

Year:
1982
Language:
english
File:
PDF, 807 KB
english, 1982
22

Pass-transistor logic design

Year:
1991
Language:
english
File:
PDF, 174 KB
english, 1991
23

Assessing vulnerability exploitability risk using software properties

Year:
2016
Language:
english
File:
PDF, 1.97 MB
english, 2016
25

Modeling Skewness in Vulnerability Discovery

Year:
2014
Language:
english
File:
PDF, 1.98 MB
english, 2014
31

Fault Modeling of ECL for High Fault Coverage of Physical Defects

Year:
1996
Language:
english
File:
PDF, 2.85 MB
english, 1996
33

Antirandom Testing: A Distance-Based Approach

Year:
2008
Language:
english
File:
PDF, 1.83 MB
english, 2008
34

Resolution Enhancement in I DDQ Testing for Large ICs

Year:
1994
Language:
english
File:
PDF, 2.37 MB
english, 1994